Stability and Performance Improvement with Feedback in VRM Transconductance Error Amplifiers...
Podcast with Steve Sandler: How To Measure Controlled Loop Stability and 12-Week Online Master Class
Tektronix Innovation Forum 2022 Session with Steve Sandler
Do you need thick copper layers in PCBs for high currents? Are you sure?
A Bode Plot Without Access to the Control Loop
Tektronix Innovation Forum 2021 Sessions with Steve Sandler
Solving Power Integrity Test Challenges with Guest Speaker for Q&A Steve Sandler of Picotest
Picotest 2-port Probe Impedance Measurements
App Note: NISM using the P2102A Probe and E5061B VNA
Power Integrity Assessment and Optimization in the Frequency Domain
Tektronix App Note: Measuring the Control Loop Response of a Power Supply Using an Oscilloscope
DC/DC Converter Layout Discussion
Webinar: Extending the Functionality of the Oscilloscope
Webinar: Measuring and Interpreting Impedance Data
Characterizing and Selecting the VRM
Accurately measure ceramic capacitors by extending VNA range
Introduction to NISM – Non-Invasive Stability Measurement with Steve Sandler
Characterizing and Modeling Switch Mode Power Supplies (Mar 15)